mirror of
https://github.com/isc-projects/bind9.git
synced 2026-06-05 02:42:04 -04:00
f7bdab0591
This reverts commit 6cdeb5b046 which added
wrapper around all the unit tests that would run the unit test in the
forked process.
This makes any debugging of the unit tests too hard. Futures attempts to
fix #3980 (closed) should add a custom automake test harness (log
driver) that would kill the unit test after configured timeout.
119 lines
3.8 KiB
C
119 lines
3.8 KiB
C
/*
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* Copyright (C) Internet Systems Consortium, Inc. ("ISC")
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*
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* SPDX-License-Identifier: MPL-2.0
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*
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* This Source Code Form is subject to the terms of the Mozilla Public
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* License, v. 2.0. If a copy of the MPL was not distributed with this
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* file, you can obtain one at https://mozilla.org/MPL/2.0/.
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*
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* See the COPYRIGHT file distributed with this work for additional
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* information regarding copyright ownership.
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*/
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#pragma once
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/*! \file */
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#include <inttypes.h>
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#include <stdbool.h>
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#include <uv.h>
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#include <isc/buffer.h>
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#include <isc/hash.h>
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#include <isc/log.h>
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#include <isc/mem.h>
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#include <isc/netmgr.h>
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#include <isc/print.h>
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#include <isc/result.h>
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#include <isc/string.h>
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#include <isc/task.h>
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#include <isc/timer.h>
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#include <isc/util.h>
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#include "netmgr_p.h"
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#include "task_p.h"
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#include "timer_p.h"
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#define CHECK(r) \
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do { \
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result = (r); \
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if (result != ISC_R_SUCCESS) \
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goto cleanup; \
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} while (0)
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extern isc_mem_t *mctx;
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extern isc_nm_t *netmgr;
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extern isc_taskmgr_t *taskmgr;
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extern isc_timermgr_t *timermgr;
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extern unsigned int workers;
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extern isc_task_t *maintask;
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#define isc_test_nap(ms) uv_sleep(ms)
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int
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setup_managers(void **state);
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int
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teardown_managers(void **state);
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#ifndef TESTS_DIR
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#define TESTS_DIR "./"
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#endif
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/* clang-format off */
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/* Copied from cmocka */
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#define ISC_TEST_ENTRY(name) \
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{ #name, run_test_##name, NULL, NULL, NULL },
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#define ISC_TEST_ENTRY_SETUP(name) \
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{ #name, run_test_##name, setup_test_##name, NULL, NULL },
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#define ISC_TEST_ENTRY_TEARDOWN(name) \
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{ #name, run_test_##name, NULL, teardown_test_##name, NULL },
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#define ISC_TEST_ENTRY_SETUP_TEARDOWN(name) \
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{ #name, run_test_##name, setup_test_##name, teardown_test_##name, NULL },
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#define ISC_TEST_ENTRY_CUSTOM(name, setup, teardown) \
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{ #name, run_test_##name, setup, teardown, NULL },
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/* clang-format on */
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#define ISC_SETUP_TEST_DECLARE(name) \
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int setup_test_##name(void **state __attribute__((unused)));
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#define ISC_RUN_TEST_DECLARE(name) \
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void run_test_##name(void **state __attribute__((unused)));
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#define ISC_TEARDOWN_TEST_DECLARE(name) \
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int teardown_test_##name(void **state __attribute__((unused)))
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#define ISC_SETUP_TEST_IMPL(name) \
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int setup_test_##name(void **state __attribute__((unused))); \
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int setup_test_##name(void **state __attribute__((unused)))
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#define ISC_RUN_TEST_IMPL(name) \
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void run_test_##name(void **state __attribute__((unused))); \
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void run_test_##name(void **state __attribute__((unused)))
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#define ISC_TEARDOWN_TEST_IMPL(name) \
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int teardown_test_##name(void **state __attribute__((unused))); \
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int teardown_test_##name(void **state __attribute__((unused)))
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#define ISC_TEST_LIST_START const struct CMUnitTest tests[] = {
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#define ISC_TEST_LIST_END \
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} \
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;
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#define ISC_TEST_MAIN ISC_TEST_MAIN_CUSTOM(NULL, NULL)
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#define ISC_TEST_MAIN_CUSTOM(setup, teardown) \
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int main(void) { \
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int r; \
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\
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signal(SIGPIPE, SIG_IGN); \
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\
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isc_mem_debugging |= ISC_MEM_DEBUGRECORD; \
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isc_mem_create(&mctx); \
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\
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r = cmocka_run_group_tests(tests, setup, teardown); \
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\
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isc_mem_destroy(&mctx); \
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\
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return (r); \
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}
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